Event Detector System - メーカー・企業と製品の一覧

Event Detector Systemの製品一覧

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Event Detector System (Linked with Shock Testing Machine)

- In tests such as drop impact tests, where mechanical stress is applied at regular intervals, resistance value data is collected for 10 msec for each stress cycle (10,000 points at 1 μsec intervals). - In the standard configuration, it is possible to simultaneously collect, judge, and save data from up to 16 channels. - Instantaneous interruption detection and waveform information acquisition are executed simultaneously. - Collected list data and waveform data can also be analyzed using the included Viewer software. - Stress simulation services can also be proposed.

企業：Wave Technology
価格：Other

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Event Detector System (Linked with Environmental Test Chamber)

- It is a system that can monitor the momentary disconnection of the conductive part with a resolution of 1μsec, in conjunction with the temperature cycle chamber. - It is utilized in connection reliability tests of semiconductor packages, among other applications.